Fig. 5.

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Représentation de l’inverse de la raideur de contact en fonction de l’inverse de la racine carrée de l’aire de contact pour les essais effectués avec les trois instruments nano, micro et macro. Les résultats ont été déjà corrigés de la complaisance de la machine, Cf. Enano, Emicro et Emacro, sont les modules de Young à chaque échelle. Mode de déformation : pile-up (39HRC, 63.4HRC et aluminium), sink-in (SS304).

Representation of the inverse contact stiffness as a function of the inverse square root of the contact area for the tests performed with the three instruments nano, micro and macro. The results were corrected with the frame compliance, Cf. Enano, Emicro and Emacro, are the Young’s modulus of materials at each scale. Deformation mode: pile-up (39HRC, 63.4HRC and aluminum), sink-in (SS304).

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