Free Access
Fig. 5.
Download original image
Images AFM d’empreintes résiduelles après décharge du GaN (a) non-irradié et (b) irradié à une fluence de 1013 ions/cm2 (profondeur de pénétration de 1 μm).
AFM images of residual prints after unloading of the GaN (a) non-irradiated and (b) irradiated using a fluency of 1013 ions/cm2 (penetration depth of 1 μm).
This figure is made of several images, please see below:
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.