| Issue |
Matériaux & Techniques
Volume 88, Number 3-4, 2000
|
|
|---|---|---|
| Page(s) | 61 - 67 | |
| DOI | https://doi.org/10.1051/mattech/200088030061 | |
| Published online | 11 April 2017 | |
Quinze ans d’expérience en diffraction X sous incidence rasante
Grazing incidence x-ray diffraction : 15 years of experiments
UMR 5621 « Ingénierie et Fonctionnalisation des Surfaces » École Centrale de Lyon, B.P. 163, 69131 Ecully Cedex (France)
La diffraction X sous incidence rasante (GXRD) est une méthode non destructive d’analyse des phases superficielles (de 10-9 à 10-6 m) basée sur la théorie de réflexion totale (Descartes, Fresnel).
Dans cet article nous montrons les potentialités de cette technique à l’aide de différents exemples tirés de quinze ans de travaux effectués sur l’installation originale de l’École Centrale de Lyon.
Abstract
Grazing Incidence X Ray Diffraction (GXRD), based on the total reflection theory (Descartes, Fresnel) is a non-destructive method for the analysis of superficial phases (from 10-9 to 10-6 m).
In this paper the potentialities of this technic are proved with the aid of some examples taken from fifteen years experiments performed on the original equipment located in Ecole Centrale de Lyon.
© SIRPE 2000
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